Static electricity problem: ESD can cause transistor gate breakdown or interconnect circuit melting, leading to calculation errors or chip failure. Electrostatic adsorption of particles leads to a decrease in signal integrity, which affects the efficiency of AI model training. Static electricity interferes with optical components or microelectromechanical structures, leading to data acquisition deviations.

Solution: The humidity in the chip manufacturing workshop is maintained at 45% -55% RH, and the surface charge of the wafer is neutralized with an ion fan or static eliminator.